BS EN 60205-2001 磁性零件有效参数的计算

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【英文标准名称】:Calculationoftheeffectiveparametersofmagneticpieceparts
【原文标准名称】:磁性零件有效参数的计算
【标准号】:BSEN60205-2001
【标准状态】:作废
【国别】:英国
【发布日期】:2001-08-15
【实施或试行日期】:2001-08-15
【发布单位】:英国标准学会(BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:电气元件;数学计算;磁路;电子设备及元件;材料的磁性能;磁芯
【英文主题词】:Components;Electricalengineering;Ferritcores;Ferroelectricmaterials;Magneticcomponents;Magnetism;Mathematicalcalculations;Mouldedparts;Parameters;R.M.S.value
【摘要】:Coverscalculationforclosedcircuitferromagneticmaterial.
【中国标准分类号】:L19
【国际标准分类号】:29_100_10
【页数】:28P;A4
【正文语种】:英语


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【英文标准名称】:Fineceramics(advancedceramics,advancedtechnicalceramics)-Weibullstatisticsforstrengthdata
【原文标准名称】:细陶瓷(高级陶瓷、高级工业陶瓷).强度数据的维伯统计
【标准号】:ISO20501-2003
【标准状态】:现行
【国别】:国际
【发布日期】:2003-12
【实施或试行日期】:
【发布单位】:国际标准化组织(IX-ISO)
【起草单位】:ISO/TC206
【标准类型】:()
【标准水平】:()
【中文主题词】:陶瓷;测定;试验方法;统计分布;高级工业陶瓷;机械试验;定义;探伤;试验;材料强度;魏布尔分布
【英文主题词】:Advancedtechnicalceramics;Ceramics;Definitions;Determination;Flawdetection;Mechanicaltesting;Statisticaldistribution;Strengthofmaterials;Testmethod;Testing;Weibulldistribution
【摘要】:ThisInternationalStandardcoversthereportingofuniaxialstrengthdataandtheestimationofprobabilitydistributionparametersforadvancedceramicswhichfailinabrittlefashion.Thefailurestrengthofadvancedceramicsistreatedasacontinuousrandomvariable.Typically,anumberoftestspecimenswithwell-definedgeometryarebroughttofailureunderwell-definedisothermalloadingconditions.Theloadatwhicheachspecimenfailsisrecorded.Theresultingfailurestressesareusedtoobtainparameterestimatesassociatedwiththeunderlyingpopulationdistribution.ThisInternationalStandardisrestrictedtotheassumptionthatthedistributionunderlyingthefailurestrengthsisthetwo-parameterWeibulldistributionwithsizescaling.Furthermore,thisInternationalStandardisrestrictedtotestspecimens(tensile,flexural,pressurizedring,etc.)thatareprimarilysubjectedtouniaxialstressstates.Subclauses5.4and5.5outlinemethodsofcorrectingforbiaserrorsintheestimatedWeibullparameters,andtocalculateconfidenceboundsonthoseestimatesfromdatasetswhereallfailuresoriginatefromasingleflawpopulation(i.e.,asinglefailuremode).Insampleswherefailuresoriginatefrommultipleindependentflawpopulations(e.g.,competingfailuremodes),themethodsoutlinedin5.4and5.5forbiascorrectionandconfidenceboundsarenotapplicable.Measurementsofthestrengthatfailurearetakenforoneoftworeasons:eitherforacomparisonoftherelativequalityoftwomaterials,orthepredictionoftheprobabilityoffailure(oralternativelythefracturestrength)forastructureofinterest.ThisInternationalStandardpermitsestimatesofthedistributionparameterswhichareneededforeither.Inaddition,thisInternationalStandardencouragestheintegrationofmechanicalpropertydataandfractographicanalysis.
【中国标准分类号】:Q32
【国际标准分类号】:81_060_30
【页数】:33P.;A4
【正文语种】:英语


【英文标准名称】:Semiconductoroptoelectronicdevicesforfibreopticsystemapplications-Part1:Essentialratingsandcharacteristics;Amendment1
【原文标准名称】:光纤系统用半导体光电器件.第1部分:基本额定值及特性.修改件1
【标准号】:IEC62007-1AMD1-1998
【标准状态】:作废
【国别】:国际
【发布日期】:1998-08
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/TC86
【标准类型】:()
【标准水平】:()
【中文主题词】:光电子器件;电子设备及元件;半导体器件;极限(数学);光波导;额定值
【英文主题词】:Definition;Definitions;Diodes;Discretedevices;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Fibreoptics;Infraredhight-emittingdiodes;Inspection;Integratedcircuits;Laserdiodes;Lasermodules;Light-emittingdevices;Light-emittingdiodes;Limits(mathematics);Marking;Measurement;Measuringtechniques;Opticalwaveguides;Optoelectronicdevices;Optoelectronics;Photodiodes;Photoelectricdevices;Phototransistors;Ratings;Semiconductordevices;Semiconductordiodes;Semiconductors;Specification(approval)
【摘要】:
【中国标准分类号】:M33;L53
【国际标准分类号】:31_260
【页数】:15P;A4
【正文语种】:英语